產(chǎn)品詳情
  • 產(chǎn)品名稱:溫度沖擊試驗(yàn)箱

  • 產(chǎn)品型號(hào):SZ-XHD-100L
  • 產(chǎn)品廠商:其它品牌
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簡單介紹:
測試產(chǎn)品有五金端子、塑料、橡膠、電子,電池,手機(jī),等材料行業(yè)必備的測試設(shè)備,測試材料結(jié)構(gòu)或復(fù)合材料,在瞬間下經(jīng)極高溫及極低溫的連續(xù)環(huán)境下忍受的程度,得以在短時(shí)間內(nèi)檢測試樣因熱脹冷縮所引起的化學(xué)變化或物理傷害環(huán)境條件下貯存和使用的適應(yīng)性,適用于學(xué)校,工廠,**,科研,等單位。 Test products are hardware terminals, plastic, rubber, electronics, batteries, cell phone, materials industry such as the necessary test equipment, test material or composite structure, in an instant by extremely high temperature and low temperature under conti
詳情介紹:
試驗(yàn)箱測試標(biāo)準(zhǔn)
Test chamber test standard
GB/T 2423.22-2012 第2部分:試驗(yàn)方法 試驗(yàn)N:溫度變化 ;
IEC 60068-2-14-2009 環(huán)境試驗(yàn) 第2-14部分試驗(yàn) 試驗(yàn)N溫度變化; 
GJB 150.5A-2009 溫度沖擊試驗(yàn);
GJB 360B-2009 電子及電氣元件試驗(yàn)方法。
       Part 2: test methods. Test N: change in temperature.
IEC 60068-2-14-2009 environmental tests -- part 2-14 tests N temperature variation;
GJB 150.5a-2009 temperature impact test;
GJB 360b-2009 test method for electronic and electrical components.
試驗(yàn)箱性能確認(rèn)符合標(biāo)準(zhǔn)
The test chamber performance is confirmed to meet the standard
GB/T2424.5-2006電工電子產(chǎn)品環(huán)境試驗(yàn) 溫度試驗(yàn)箱性能確認(rèn);
GB/T5170.2-2008電子電工產(chǎn)品環(huán)境試驗(yàn)設(shè)備檢驗(yàn)方法+溫度試驗(yàn)設(shè)備;
JJF1101-2003環(huán)境試驗(yàn)設(shè)備溫度、濕度校準(zhǔn)規(guī)范
Confirm the performance of environmental test temperature test chamber for electrical and electronic products;
Test method of environmental test equipment for electronic and electrical products + temperature test equipment;

Jjf1101-2003 calibration specification for temperature and humidity of environmental test equipment


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